Join Us at Microscopy and Microanalysis 2026
(C) Microscopy Society of America 2026
Our group has a strong showing at Microscopy and Microanalysis 2026 in Milwaukee this week, with presentations spanning autonomous materials processing, multimodal characterization, agentic AI frameworks, and battery feedstock analysis.
Talks
Steven Spurgeon: "From Observation to Orchestration: The Autonomous Multi-Modal Characterization and Processing Platform" | Mon Aug 4, 2:30 PM | S201 D
Michelle Smeaton: "Atomic-Scale Statistical Analysis of Interface Structure and Stability in NiO/Ga₂O₃ Heterojunctions" | Tue Aug 5, 2:15 PM | S102 C
Renae Gannon: "Accelerating Real-Time Autonomous Workflows in Plasma Focused Ion Beam Microscopy" | Wed Aug 6, 2:30 PM | S103 D
Posters — Thu Aug 7, 10:00 AM–12:00 PM
Emily Avey: "404 Operator Not Found: Scanning Transmission Electron Microscopy Automation for Materials Characterization"
Andy Borch: "The AI-Augmented Researcher: A Domain-Agnostic LLM Framework for Intelligent Experiment Planning and Instrument Control"
Jayden Grunde: "Toward Autonomous Materials Processing in the Plasma Focused Ion Beam"
Ben Wyland: "Automatic Microscopic Particle Segmentation (AMPS)"
If you're attending M&M this week, come find us.